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Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio
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Authors
Kulkarni, S.R.
;
Schrimpf, R.D.
;
Galloway, K.F.
;
Claeys, Cor
;
Simoen, Eddy
Conference
8th European Workshop on Radiation Effects on Components and Systems - RADECS
Title
Total ionizing dose effect on depletion mode Ge pMOSFETs with high-k gate stack: on-off current ratio
Publication type
Proceedings paper
Embargo date
9999-12-31
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