Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS

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Authors

Moens, Peter; Van den Bosch, Geert

ISSN

0026-2714

Issue

8_9

Journal

Microelectronics Reliability

Volume

48

Title

Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS

Publication type

Journal article

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