Authors

Simoen, Eddy; Brouwers, Gijs; Eneman, Geert; Bargallo Gonzalez, Mireia; De Jaeger, Brice; Mitard, Jerome; Brunco, David; Souriau, Laurent; Cody, N.; Thomas, S.; Meuris, Marc

ISSN

1369-8001

Issue

5_6

Journal

Materials Science in Semiconductor Processing

Volume

11

Title

Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers

Publication type

Journal article