Authors

Zhang, W.D.; Govoreanu, Bogdan; Zheng, X.F.; Ruiz Aguado, Daniel; Rosmeulen, Maarten; Blomme, Pieter; Zhang, J.F.; Van Houdt, Jan

ISSN

0741-3106

Issue

9

Journal

IEEE Electron Device Letters

Volume

29

Title

Two-pulse C-V: a new method for characterization electron traps in the bulk of SiO2/high-k dielectric stacks

Publication type

Journal article

Embargo date

9999-12-31