Authors

Franco, Jacopo; Kaczer, Ben; Stesmans, Andre; Afanasiev, Valeri; Martens, Koen; Aoulaiche, Marc; Grasser, Tibor; Mitard, Jerome; Groeseneken, Guido

Conference

40th IEEE Semiconductor Interface Specialists Conference - SISC

Title

Impact of Si-passivation thickness and processing on NBTI reliability of Ge and SiGe pMOSFETs

Publication type

Meeting abstract