Publication:
Improvement in NBTI reliability of Si-passivated Ge/high-k/metal-gate pFETs
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1834 since deposited on 2021-10-17
2last month
Acq. date: 2026-01-07
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Views
1834 since deposited on 2021-10-17
2last month
Acq. date: 2026-01-07
Citations