Oxidation behavior of Ni thin films: application to NiO-based ReRAM

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Authors
Lisoni, Judit; Goux, Ludovic; Verleysen, Eveline; Wang, Xin Peng; Jurczak, Gosia; Wouters, Dirk
Conference
MRS Spring Meeting Symposium H: Materials and Physics for Nonvolatile Memories
Title
Oxidation behavior of Ni thin films: application to NiO-based ReRAM
Publication type
Meeting abstract
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