Publication:
Quantification of MOSFET device reliability with low-Vt lanthanum-incorporated high permittivity dielectrics
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1973 since deposited on 2021-10-18
2last month
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Acq. date: 2026-01-09
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1973 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-01-09
Citations