Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments
View/
open
1585.pdf (367.4Kb)
Metadata
Show full item record
Authors
Vanhellemont, Jan
;
Kissinger, G.
;
Clauws, P.
;
Kaniava, Arvydas
;
Libezny, Milan
;
Gaubas, Eugenijus
;
Simoen, Eddy
;
Richter, H.
;
Claeys, Cor
Conference
Proceedings of the 6th Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology - GADEST'95
Title
Infrared studies of oxygen precipitation related defects in silicon after various thermal treatments
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login