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Impact of the TiN layer thickness on the low-frequency noise and static device performance of n-channel MuGFETs
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Authors
Rodrigues, Michele
;
Mercha, Abdelkarim
;
Collaert, Nadine
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, J.A.
Conference
20th International Conference on Noise and Fluctuations - ICNF
Title
Impact of the TiN layer thickness on the low-frequency noise and static device performance of n-channel MuGFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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