Publication:
Analysis of the interface trap density in SOI FinFETs with different TiN gate electrode thickness through charge pumping technique
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1888 since deposited on 2021-10-18
3last month
Acq. date: 2026-01-07
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Metrics
Views
1888 since deposited on 2021-10-18
3last month
Acq. date: 2026-01-07
Citations