Publication:
A low-frequency noise study of the physical hot-carrier degradation mechanisms in lowly-doped-drain Si MOSFETs
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2002 since deposited on 2021-09-29
2last month
Acq. date: 2025-12-08
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Metrics
Views
2002 since deposited on 2021-09-29
2last month
Acq. date: 2025-12-08
Citations