Authors

Zahid, Mohammed; Degraeve, Robin; Cho, Moon Ju; Pantisano, Luigi; Van Houdt, Jan; Groeseneken, Guido; Jurczak, Gosia; Ruiz Aguado, Daniel

Conference

47th Annual IEEE International Reliability Physics Symposium - IRPS

Title

Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)

Publication type

Proceedings paper

Embargo date

9999-12-31