Publication:
Defect profiling in the SiO2/Al2O3 interface using variable Tcharge-Tdischarge amplitude charge pumping (VT2ACP)
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1980 since deposited on 2021-10-18
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Acq. date: 2026-01-10
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1980 since deposited on 2021-10-18
4last month
2last week
Acq. date: 2026-01-10
Citations