Authors

Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido

ISSN

0167-9317

Issue

1

Journal

Microelectronic Engineering

Volume

87

Title

Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

Publication type

Journal article

Embargo date

9999-12-31