Publication:

Effective reduction of interfacial traps in Al2O3 /GaAs(001) gate stacks using surface engineering and thermal annealing

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1909 since deposited on 2021-10-18
Acq. date: 2026-02-27

Citations

Statistics

Views

1909 since deposited on 2021-10-18
Acq. date: 2026-02-27

Citations