Publication:

A low-voltage biasing scheme for aggressively scaled bulk FinFET 1T-DRAM featuring 10s retention at 85°C

Date

2010

Proceedings Paper

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Files

20208.pdf 409.81 KB

Author(s)

Collaert, Nadine

;

Aoulaiche, Marc

;

De Wachter, Bart

;

Rakowski, Michal

;

Redolfi, Augusto

;

;

De Keersgieter, An

;

Horiguchi, Naoto

;

Altimime, Laith

;

Statistics

1970 since deposited on 2021-10-18

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Acq. date: 2026-08-09