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Optimized post-CMP and Pre-Epi cleans to enable smooth and high quality epitaxial strained Ge growth on SiGe strain relaxed buffers
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Optimized post-CMP and Pre-Epi cleans to enable smooth and high quality epitaxial strained Ge growth on SiGe strain relaxed buffers
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Date
2010-09
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Loo, Roger
;
Souriau, Laurent
;
Ong, Patrick
;
Kenis, Karine
;
Rip, Jens
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1868
since deposited on 2021-10-18
Acq. date: 2026-01-09
Citations
Metrics
Views
1868
since deposited on 2021-10-18
Acq. date: 2026-01-09
Citations