Authors

Martin-Martinez, J.; Amat, E.; Gonzalez, Mario; Verheyen, Peter; Rooyackers, Rita; Rodriguez, R.; Nafria, M.; Aymerich, X.; Simoen, Eddy

ISSN

0026-2714

Issue

9_11

Journal

Microelectronics Reliability

Volume

50

Title

SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

Publication type

Journal article