Publication:
Freeze-out effects on the characteristics of deep submicron Si nMOSFETSs in the 77 K to 300 K range
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1979 since deposited on 2021-09-30
Acq. date: 2025-10-23
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1979 since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations