Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs

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Authors

Put, Sofie; Mehta, H.; Collaert, Nadine; Van Uffelen, M.; Leroux, P.; Claeys, Cor; Lukyanchikova, N.; Simoen, Eddy

ISSN

0038-1101

Issue

2

Journal

Solid-State Electronics

Volume

54

Title

Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs

Publication type

Journal article

Embargo date

9999-12-31

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