Authors

Put, Sofie; Simoen, Eddy; Collaert, Nadine; De Keersgieter, An; Claeys, Cor; Van Uffelen, Marco; Leroux, Paul

ISSN

0018-9499

Issue

4

Journal

IEEE Transactions on Nuclear Science

Volume

57

Title

Influence of back-gate bias and process conditions on the gamma degradation of the transconductance of MuGFETs

Publication type

Journal article

Embargo date

9999-12-31