Authors

Rodrigues, M.; Martino, J.A.; Mercha, Abdelkarim; Collaert, Nadine; Simoen, Eddy; Claeys, Cor

ISSN

0038-1101

Issue

12

Journal

Solid-State Electronics

Volume

54

Title

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p- channel MuGFETs

Publication type

Journal article

Embargo date

9999-12-31