Publication:
Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p- channel MuGFETs
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1903 since deposited on 2021-10-18
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Acq. date: 2026-08-11
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Statistics
Views
1903 since deposited on 2021-10-18
3last month
3last week
Acq. date: 2026-08-11
Citations