Low-frequency noise in strained and relaxed Ge pMOSFETs

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Authors
Simoen, Eddy; Mitard, Jerome; De Jaeger, Brice; Eneman, Geert; Dobbie, A.; Myronov, M.; Leadley, D.R.; Meuris, Marc; Hoffmann, Thomas Y.; Claeys, Cor
Conference
International Conference on Solid-State and Integrated Circuit Technology
Title
Low-frequency noise in strained and relaxed Ge pMOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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