Authors

Suhane, Amit; Arreghini, Antonio; Van den Bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan

ISSN

0741-3106

Issue

9

Journal

IEEE Electron Device Letters

Volume

31

Title

Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories

Publication type

Journal article

Embargo date

9999-12-31