Publication:

Assessment of Ge1-xSnx alloys for strained Ge CMOS devices

Date

2010

Meeting abstract

Simple item page Full metadata Statistics

Files

21497.pdf 20.4 KB

Author(s)

;

;

;

Vincent, Benjamin

;

;

Clarysse, Trudo

;

Demeulemeester, J.

;

;

Vantomme, Andre

;

Dekoster, Johan

;

;

;

;

;

Metrics

1970 since deposited on 2021-10-18

Acq. date: 2026-01-10