Publication:
Marial characterization of Ge1-xSnx alloys for strained Ge CMOS devices
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1894 since deposited on 2021-10-18
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Acq. date: 2025-10-24
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Views
1894 since deposited on 2021-10-18
402item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations