Publication:
Vertical localization of trapped holes in SiON pMOSFETs after positive and negative gate stress
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1838 since deposited on 2021-10-18
3last month
Acq. date: 2026-02-24
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Statistics
Views
1838 since deposited on 2021-10-18
3last month
Acq. date: 2026-02-24
Citations