Authors

Zahid, Mohammed; Ruiz Aguado, Daniel; Degraeve, Robin; Wang, W.C; Govoreanu, Bogdan; Toledano Luque, Maria; Afanasiev, V.V.; Van Houdt, Jan

ISSN

10.1109/TED.2010

Issue

11

Journal

IEEE Transactions on Electron Devices

Volume

57

Title

Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability

Publication type

Journal article

Embargo date

9999-12-31