Effects of processing and radiation bias on leakage currents in Ge pMOSFETs

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Authors

Zhang, Cher Xuan; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Galloway, Kenneth F.; Simoen, Eddy; Mitard, Jerome; Claeys, Cor

ISSN

0018-9499

Issue

6

Journal

IEEE Transactions on Nuclear Science

Volume

57

Title

Effects of processing and radiation bias on leakage currents in Ge pMOSFETs

Publication type

Journal article

Embargo date

9999-12-31

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