Authors

Zheng, X.F.; Zhang, W.D.; Govoreanu, Bogdan; Ruiz Aguado, Daniel; Zhang, .F.; Van Houdt, Jan

ISSN

0018-9383

Issue

1

Journal

IEEE Transactions on Electron Devices

Volume

57

Title

Energy and spatial distributions of electron traps throughout Sio2/Al2O3 stacks as the IPD in flash memory application

Publication type

Journal article

Embargo date

9999-12-31