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LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric
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Authors
Lukyanchikova, N.
;
Garbar, N.
;
Kudina, V.
;
Smolanka, A.
;
Simoen, Eddy
;
Claeys, Cor
ISSN
0038-1101
Issue
1
Journal
Solid-State Electronics
Volume
63
Title
LKE and BGI Lorentzian noise in strained and non-strained tri-gate SOI FinFETs with HfSiON/SiO2 gate dielectric
Publication type
Journal article
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