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Articles
GaN-based HEMTs tested under high temperature storage test
Publication:
GaN-based HEMTs tested under high temperature storage test
Date
2011
Journal article
https://doi.org/10.1016/
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marcon, Denis
;
Kang, Xuanwu
;
Viaene, John
;
Van Hove, Marleen
;
Srivastava, Puneet
;
Decoutere, Stefaan
;
Mertens, Robert
;
Borghs, Gustaaf
Journal
Microelectronics Reliability
Abstract
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2009
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
2009
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations