Publication:

Investigation of the electrical properties of Ge/high-k gate stack: GeO2 VS Si-cap

Date

2011
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Author(s)

Mitard, Jerome  
;
Bellenger, Florence
;
Witters, Liesbeth  
;
De Jaeger, Brice  
;
Vincent, Benjamin  
;
Nyns, Laura  
;
Martens, Koen  
;
Vrancken, Evi  
;
Wang, Gang
;
Lin, Dennis  
;
Loo, Roger  
;
Caymax, Matty  
;
De Meyer, Kristin  
;
Heyns, Marc  
;
Horiguchi, Naoto  

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