Ge1-xSnx stressors for strained-Ge CMOS

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Author(s)

Takeuchi, Shotaro

;

Shimura, Yosuke

;

;

Vincent, Benjamin

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;

Clarysse, Trudo

;

Demeulemeester, Jelle

;

Vantomme, Andre

;

Dekoster, Johan

;

;

;

;

Nakatsuka, Osaku

;

Zaima, Shigeaki

Journal

Solid-State Electronics

Metrics

1938 since deposited on 2021-10-19

Acq. date: 2025-10-24