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Zero-energy SIMS depth profiling: the role of surface roughness development with XeF2 based etching
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2009 since deposited on 2021-10-19
1last month
Acq. date: 2026-01-09
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Metrics
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2009 since deposited on 2021-10-19
1last month
Acq. date: 2026-01-09
Citations