Publication:

Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors

Date

2011

Journal article

Simple item page Full metadata Statistics

Files

20774.pdf 1.09 MB

Author(s)

Vincent, Benjamin

;

;

Takeuchi, Shotaro

;

;

;

Firrincieli, Andrea

;

Demeulemeester, Jelle

;

Vantomme, Andre

;

Clarysse, Trudo

;

;

;

Dekoster, Johan

;

;

Journal

Microelectronic Engineering

Statistics

1924 since deposited on 2021-10-19

Acq. date: 2026-02-26