Publication:
Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1934 since deposited on 2021-09-30
1last month
Acq. date: 2026-03-17
Citations
Statistics
Views
1934 since deposited on 2021-09-30
1last month
Acq. date: 2026-03-17
Citations