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Internal photoemission at interfaces of ALD TaiOx insulating layers deposited on Si, InP and In0.53Ga0.47As
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Internal photoemission at interfaces of ALD TaiOx insulating layers deposited on Si, InP and In0.53Ga0.47As
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2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chou, H.-Y.
;
Afanasiev, Valeri
;
Thoan, N.H.
;
Adelmann, Christoph
;
Lin, Dennis
;
Houssa, Michel
;
Stesmans, Andre
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Views
1920
since deposited on 2021-10-20
2
last month
1
last week
Acq. date: 2025-12-10
Citations