Publication:
On the characterization of the strain field of lattice defects in silicon with nanometer resolution
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2083 since deposited on 2021-09-29
2last month
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Acq. date: 2026-08-09
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Statistics
Views
2083 since deposited on 2021-09-29
2last month
1last week
Acq. date: 2026-08-09
Citations