Publication:
SiGe or GeSn source/drain stressors on strained SiGe-channel pFETS: a TCAD study
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1791 since deposited on 2021-10-20
2last month
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Acq. date: 2026-05-20
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Statistics
Views
1791 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-05-20
Citations