Publication:

Reliability of SiGe Channel MOS

Date

2012
Proceedings Paper
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Author(s)

Franco, Jacopo  
;
Kaczer, Ben  
;
Mitard, Jerome  
;
Toledano Luque, Maria
;
Eneman, Geert  
;
Roussel, Philippe  
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Witters, Liesbeth  
;
Hikavyy, Andriy  
;
Hellings, Geert  
;
Ragnarsson, Lars-Ake  
;
Horiguchi, Naoto  
;
Grasser, T.
;
Heyns, Marc  
;
Groeseneken, Guido  

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