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Reliability of SiGe Channel MOS
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Authors
Franco, Jacopo
;
Kaczer, Ben
;
Mitard, Jerome
;
Toledano Luque, Maria
;
Eneman, Geert
;
Roussel, Philippe
;
Cho, Moon Ju
;
Kauerauf, Thomas
;
Witters, Liesbeth
;
Hikavyy, Andriy
;
Hellings, Geert
;
Ragnarsson, Lars-Ake
;
Horiguchi, Naoto
;
Grasser, T.
;
Heyns, Marc
;
Groeseneken, Guido
Conference
SiGe, Ge, and Related Compunds 5: Materials, Processing, and Devices
Title
Reliability of SiGe Channel MOS
Publication type
Proceedings paper
Embargo date
9999-12-31
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