Authors

Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Bukhori, Muhammad Faiz; Roussel, Philippe; Grasser, Tibor; Asenov, Asen; Groeseneken, Guido

ISSN

0741-3106

Issue

6

Journal

IEEE Electron Device Letters

Volume

33

Title

Impact of individual charged gate oxide defects on the entire ID-VG characteristic of nanoscaled FETs

Publication type

Journal article

Embargo date

9999-12-31