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An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors
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Authors
Hikavyy, Andriy
;
Witters, Liesbeth
;
Mitard, Jerome
;
Vanherle, Wendy
;
Vandervorst, Wilfried
;
Dekoster, Johan
;
Loo, Roger
;
Caymax, Matty
Conference
International Silicon-Germanium Technology and Device Meeting
Title
An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors
Publication type
Meeting abstract
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