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An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors
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1936 since deposited on 2021-10-20
1last month
Acq. date: 2026-01-11
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Metrics
Views
1936 since deposited on 2021-10-20
1last month
Acq. date: 2026-01-11
Citations