Publication:
An investigation of growth and properties of Si capping layers used in advanced SiGe/Ge based pMOS transistors
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1935 since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations
Metrics
Views
1935 since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations