Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs

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Authors
Lin, Dennis; Alian, AliReza; Gupta, S.; Yang, B.; Bury, Erik; Sioncke, Sonja; Degraeve, Robin; Toledano Luque, Maria; Krom, Raymond; Favia, Paola; Bender, Hugo; Caymax, Matty; Saraswat, K.C.; Collaert, Nadine; Thean, Aaron
Conference
International Electron Devices Meeting - IEDM
Title
Beyond interface: the impact of oxide border traps on InGaAs and Ge n-MOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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