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Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators
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Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martin-Martinez, Javier
;
Kaczer, Ben
;
Degraeve, Robin
;
Roussel, Philippe
;
Rodriguez, Rosana
;
Nafria, Monserrat
;
Aymerich, X.
;
Dierickx, Bart
;
Groeseneken, Guido
Journal
IEEE Transactions on Device and Materials Reliability
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1887
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Acq. date: 2025-12-10
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Views
1887
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-10
Citations