Authors

Martin-Martinez, Javier; Kaczer, Ben; Degraeve, Robin; Roussel, Philippe; Rodriguez, Rosana; Nafria, Monserrat; Aymerich, X.; Dierickx, Bart; Groeseneken, Guido

ISSN

1530-4388

Issue

1

Journal

IEEE Transactions on Device and Materials Reliability

Volume

12

Title

Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators

Publication type

Journal article

Embargo date

9999-12-31