Publication:

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1993 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-08-06

Citations

Statistics

Views

1993 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-08-06

Citations