Authors

Meneghini, M.; Bertin, M.; Dal Santo, G.; Stocco, A.; Chini, A.; Marcon, Denis; Malinowski, Pawel; Mura, G.; Musu, E.; Vanzi, M.; Meneghesso, G.; Zanoni, E.

Conference

International Electron Devices Meeting - IEDM

Title

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

Publication type

Proceedings paper