Publication:

A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1987 since deposited on 2021-10-20
418item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations

Metrics

Views

1987 since deposited on 2021-10-20
418item.page.metrics.field.last-week
Acq. date: 2025-10-25

Citations