Low-frequency noise assessment of the oxide quality of gate-last high-k pMOSFETS

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Authors

Simoen, Eddy; Veloso, Anabela; Horiguchi, Naoto; Claeys, Cor

ISSN

0741-3106

Issue

10

Journal

IEEE Electron Device Letters

Volume

33

Title

Low-frequency noise assessment of the oxide quality of gate-last high-k pMOSFETS

Publication type

Journal article

Embargo date

9999-12-31

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