Publication:
Electrically active defects at the AlN/Si(111) interface studied by DLTS and ESR
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1853 since deposited on 2021-10-20
3last month
1last week
Acq. date: 2026-01-08
Citations
Metrics
Views
1853 since deposited on 2021-10-20
3last month
1last week
Acq. date: 2026-01-08
Citations