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MEMS packaging and reliability: An undividable couple
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Authors
Tilmans, Harrie
;
De Coster, Jeroen
;
Helin, Philippe
;
Cherman, Vladimir
;
Jourdain, Anne
;
De Moor, Piet
;
Vandevelde, Bart
;
Pham, Nga
;
Zekry, Joseph
;
Witvrouw, Ann
;
De Wolf, Ingrid
ISSN
0026-2714
Issue
9_10
Journal
Microelectronics Reliability
Volume
52
Title
MEMS packaging and reliability: An undividable couple
Publication type
Journal article
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