Publication:

Channel hot carrier degradation mechanism in long/short channel n-FinFETs

Date

2013

Journal article

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Author(s)

;

Roussel, Philippe

;

;

Degraeve, Robin

;

;

Aoulaiche, Marc

;

Chiarella, Thomas

;

Kauerauf, Thomas

;

Horiguchi, Naoto

;

Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Statistics

1936 since deposited on 2021-10-21

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Acq. date: 2026-03-18