Channel hot carrier degradation mechanism in long/short channel n-FinFETs

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Authors

Cho, Moon Ju; Roussel, Philippe; Kaczer, Ben; Degraeve, Robin; Franco, Jacopo; Aoulaiche, Marc; Chiarella, Thomas; Kauerauf, Thomas; Horiguchi, Naoto; Groeseneken, Guido

ISSN

0018-9383

Issue

12

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

Channel hot carrier degradation mechanism in long/short channel n-FinFETs

Publication type

Journal article

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